| Test
Equipment |
| SSE L5710 |
SSE |
256pin
10Mhz logic tester with 1M pattern memory |
| SSE High-V Tester |
SSE |
|
| SSE-5712 |
SSE |
|
| Prober
Equipment |
| TSK UF190 |
TSK |
Fully
Automatic Wafer Prober for (4”5”6”8”) wafer |
| TSK UF200 |
TSK |
Fully
Automatic Wafer Prober for (5”6”8”) wafer |
| TSK-90A |
|
|
| Handler
Equipment |
| JS-200 |
信傑實業 |
SSOP
150mil |
1 |
sets |
| JS-200 |
信傑實業 |
SOP
150mil |
7 |
sets |
| JS-400 |
信傑實業 |
SOP
300mil |
2 |
sets |
| JS-400 |
信傑實業 |
SOJ
300mil |
1 |
sets |
| JS-400 |
信傑實業 |
HSOP
300mil |
3 |
sets |
| JP-400 |
信傑實業 |
DIP
300mil |
6 |
sets |
| JP-400 |
信傑實業 |
DIP
600mil |
2 |
sets |
| RYH-1200 |
四方自動 |
QFP、TSOP |
2 |
sets |
| JT-200 |
信傑實業 |
TO-92 |
1 |
sets |
|
  |
